IEEE - Institute of Electrical and Electronics Engineers, Inc. - A CUSUM chart using absolute sample values to monitor process mean and variance

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Zhang Wu ; Mei Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China, China
Conference Date: 8 December 2009
Page(s): 414 - 418
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
DOI: 10.1109/IEEM.2009.5373322
Regular:

In Statistical Process Control (SPC), when dealing with a quality characteristic x that is a variable, it is usually necessary to monitor both the mean value and variability. By inspecting the... View More

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