IEEE - Institute of Electrical and Electronics Engineers, Inc. - The restrictions in economic design model for an x-bar control chart under non-normally distributed data with Weibull shock model

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Feng-Chia Li ; Tzu-Chin Chao ; Li-Lon Yeh ; Yen-Fu Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China, China
Conference Date: 8 December 2009
Page(s): 681 - 684
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
DOI: 10.1109/IEEM.2009.5373240
Regular:

This paper proposed an approach which simultaneously considers the properties of cost and quality based on the Burr distribution to determine three parameters (including sample size, sampling... View More

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