IEEE - Institute of Electrical and Electronics Engineers, Inc. - A simulation study of prototyping for risk reduction in product customization

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Chen, S.L. ; Zhang, Y.B. ; Chen, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China, China
Conference Date: 8 December 2009
Page(s): 1,583 - 1,587
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
DOI: 10.1109/IEEM.2009.5373104
Regular:

This paper develops a risk model that captures the inherent uncertainties concerning the value and cost of a customized product. Analysis based on the model reveals that risks may handicap... View More

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