IEEE - Institute of Electrical and Electronics Engineers, Inc. - Towards process change impact analysis in industrial engineering

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2009)

Author(s): S. Hausler ; R. Buschermohle ; R. Koppe ; A. Hahn
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China
Conference Date: 8 December 2009
Page(s): 1,489 - 1,493
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
ISSN (Electronic): 2157-362X
ISSN (Paper): 2157-3611
DOI: 10.1109/IEEM.2009.5373075
Regular:

Today, the development of large systems, is more and more based on new model driven design methods that try to overcome gaps between the engineering domains. These design methods are often... View More

Advertisement