IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quality control of architecutural design based on uniform technical standards

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Fan Chen ; Jun Chen ; Li, S.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China, China
Conference Date: 8 December 2009
Page(s): 1,362 - 1,365
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
DOI: 10.1109/IEEM.2009.5373036
Regular:

The quality of architectural design mostly rested with the individual performance of architects in the past. Today, with the increasing development of technical level, the quality of a design... View More

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