IEEE - Institute of Electrical and Electronics Engineers, Inc. - The relationship between statistical process control critical success factors and performance: A structural equation modeling approach

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Rohani, J.M. ; Yusof, S.M. ; Mohamad, I.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China, China
Conference Date: 8 December 2009
Page(s): 1,352 - 1,356
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
DOI: 10.1109/IEEM.2009.5373033
Regular:

The purpose of this paper is to explore the relationships between statistical process control (SPC) critical success factors (CSF) and performance. Empirical data were collected from 326 responses... View More

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