IEEE - Institute of Electrical and Electronics Engineers, Inc. - Estimating the inquiring time interval for the patent analysis by the technology obsolescence cycle

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Hsiao-Chung Wu ; Hung-Yi Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China, China
Conference Date: 8 December 2009
Page(s): 2,375 - 2,378
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
DOI: 10.1109/IEEM.2009.5372992
Regular:

One of key issues in patent analysis is identifying time interval for querying patent records from databases. Inquiring patents with inappropriate time interval will lead to biased results that... View More

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