IEEE - Institute of Electrical and Electronics Engineers, Inc. - Policies for probe-wear leveling in MEMS-based storage devices

2009 IEEE International Symposium on Modeling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS)

Author(s): Khatib, M.G. ; Hartel, P.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: London, United Kingdom, United Kingdom
Conference Date: 21 September 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4928-6
ISBN (Paper): 978-1-4244-4927-9
ISSN (Paper): 1526-7539
DOI: 10.1109/MASCOT.2009.5366652
Regular:

Probes (or read/write heads) in MEMS-based storage devices are susceptible to wear. We study probe wear, and analyze the causes of probe uneven wear. We show that under real-world traces some... View More

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