IEEE - Institute of Electrical and Electronics Engineers, Inc. - One way or two way globalization?-a double-learning-network framework of Chinese R&D internationalization

2009 Atlanta Conference on Science and Innovation Policy

Author(s): Di Minin, A. ; Jieyin Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Atlanta. GA, USA, USA
Conference Date: 2 October 2009
Page(s): 1 - 7
ISBN (CD): 978-1-4244-5042-8
ISBN (Paper): 978-1-4244-5041-1
DOI: 10.1109/ACSIP.2009.5367844
Regular:

In this paper we claim that the phenomenon of R&D internationalization of Chinese firms is an emerging and varied phenomenon. We establish a four-pattern learning model in a... View More

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