IEEE - Institute of Electrical and Electronics Engineers, Inc. - Power IT test-bed system for smart grid

2009 Transmission & Distribution Conference & Exposition: Asia and Pacific (T&D Asia)

Author(s): Nam-Cheol Yu ; Ji-Tae Kim ; Yong-Seok Seon ; Sang-Uk Yeo ; Joon-Hong Jung
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Seoul, South Korea, South Korea
Conference Date: 26 October 2009
Page(s): 1 - 4
ISBN (CD): 978-1-4244-5230-9
DOI: 10.1109/TD-ASIA.2009.5356843
Regular:

When merging new power IT(PIT) systems, it is necessary to evaluate operating condition in order to verify the efficiency of these systems. To do so, it is required to develop some test tool and... View More

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