IEEE - Institute of Electrical and Electronics Engineers, Inc. - The impact of technological innovation on export performance: Evidence from a cross-country analysis

2009 IEEE International Conference on Intelligent Computing and Intelligent Systems (ICIS 2009)

Author(s): Gang-Bo Wang ; Guan, J.-C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Shanghai, China, China
Conference Date: 20 November 2009
Volume: 3
Page(s): 393 - 397
ISBN (CD): 978-1-4244-4738-1
ISBN (Paper): 978-1-4244-4754-1
DOI: 10.1109/ICICISYS.2009.5358136
Regular:

This paper explores the relationship between technological innovation and export performance at the national level. This study is based on an analysis of patent and international trade statistics... View More

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