IEEE - Institute of Electrical and Electronics Engineers, Inc. - The bidirectional associative memory neural network based on fault tree and its application to inverter's fault diagnosis

2009 IEEE International Conference on Intelligent Computing and Intelligent Systems (ICIS 2009)

Author(s): Bo Fa ; Yixin Yin ; Cunfa Fu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Shanghai, China, China
Conference Date: 20 November 2009
Volume: 1
Page(s): 209 - 213
ISBN (CD): 978-1-4244-4738-1
ISBN (Paper): 978-1-4244-4754-1
DOI: 10.1109/ICICISYS.2009.5357894
Regular:

With study on Fault Tree Analysis (FTA) and Bidirectional Associative Memory (BAM) neural network, a new method of intelligent fault diagnosis is proposed. All the knowledge on the happening of... View More

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