IEEE - Institute of Electrical and Electronics Engineers, Inc. - Safety Assessment of Design Patterns for Safety-Critical Embedded Systems

2009 35th Euromicro Conference on Software Engineering and Advanced Applications (SEAA)

Author(s): Armoush, A. ; Beckschulze, E. ; Kowalewski, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2009
Conference Location: Patras, Greece, Greece
Conference Date: 27 August 2009
Page(s): 523 - 527
ISBN (Paper): 978-0-7695-3784-9
ISSN (Paper): 1089-6503
DOI: 10.1109/SEAA.2009.12
Regular:

System safety is considered as one of the most important non-functional requirements for safety-critical embedded systems. Several safety assessment methods have been proposed to evaluate... View More

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