IEEE - Institute of Electrical and Electronics Engineers, Inc. - EDA for analog DFT? - designers must get on the bus

2009 IEEE International Test Conference (ITC)

Author(s): Sunter, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355909
Regular:

Design for Test (DFT) for analog functions lags far behind that for digital functions, and as a result there is virtually no automation (except BIST for SerDes, PLL, and DDR). Before such... View More

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