IEEE - Institute of Electrical and Electronics Engineers, Inc. - Portable simulation/emulation stimulus on an industrial-strength SoC

2009 IEEE International Test Conference (ITC)

Author(s): Torres, F. ; Srivastava, R. ; Ruiz, J. ; Wen, H.-P. ; Bose, M. ; Bhadra, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355904
Regular:

Reuse of System-on-Chip (SoC) verification stimuli across various design models is a challenging problem. However, if used effectively, it significantly reduces verification time and quickly... View More

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