IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design-for-secure-test for crypto cores

2009 IEEE International Test Conference (ITC)

Author(s): Shi, Y. ; Togawa, N. ; Yanagisawa, M. ; Ohtsuki, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355900
Regular:

Scan technology carries the potential of being misused as a "side channel" to leak out the secret information of crypto cores. To address such a design challenge, this paper proposes a... View More

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