IEEE - Institute of Electrical and Electronics Engineers, Inc. - NAND flash testing: A preliminary study on actual defects

2009 IEEE International Test Conference (ITC)

Author(s): Mauroux, P.-D. ; Virazel, A. ; Bosio, A. ; Dilillo, L. ; Girard, P. ; Pravossoudovitch, S. ; Godard, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355898
Regular:

Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects... View More

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