IEEE - Institute of Electrical and Electronics Engineers, Inc. - Panel synopsis - How (Un)affordable is true cost of test?

2009 IEEE International Test Conference (ITC)

Author(s): Crouch, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355897
Regular:

For as long as semiconductor's have been made, you would think that the cost models would be understood and mature by now. But there are still aspects of "cost" that are significant and are still... View More

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