IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test chip experiments at stanford CRC

2009 IEEE International Test Conference (ITC)

Author(s): Al-Yamani, A. ; Chang, J. ; Franco, P. ; Li, J. ; Ma, S. ; Mitra, S. ; Intaik Park ; Chao-wen Tseng ; Volkerink, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355839
Regular:

The idea of the test chip experiments started in ITC 1991 [McCluskey 00]. We wanted to get actual tester data that would answer some questions about manufacturing test of digital ICs. The... View More

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