IEEE - Institute of Electrical and Electronics Engineers, Inc. - What is IEEE P1149.8.1 and why?

2009 IEEE International Test Conference (ITC)

Author(s): Parker, K. ; Burgess, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355837
Regular:

This poster will provide a high-level description of IEEE P1149.8.1 and the manufacturing board test problem set it addresses. The poster will serve as a follow on to a paper (Session 2.1) which... View More

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