IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?

2009 IEEE International Test Conference (ITC)

Author(s): Ley, A.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355828
Regular:

Non-intrusive board test (NBT) [1] is an emerging test methodology that integrates several complementary test technologies to restore test coverage lost due to diminishing physical (probe) access... View More

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