IEEE - Institute of Electrical and Electronics Engineers, Inc. - Panel Synopsis - How (Un)affordable is true cost of test?

2009 IEEE International Test Conference (ITC)

Author(s): Parekhji, Rubin A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 2
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355819
Regular:

Test cost means different things to different teams at different times, in terms of investment, spending and affordability. Long design and production life-time cycles continue to give rise to... View More

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