IEEE - Institute of Electrical and Electronics Engineers, Inc. - Eliminating product infant mortality failures using prognostic analysis

2009 IEEE International Test Conference (ITC)

Author(s): Losik, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355817
Regular:

Product factory test is inadequate to identify 100% of the products that will fail within one year of use before shipment. Product infant mortality failures that would occur after delivery are... View More

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