IEEE - Institute of Electrical and Electronics Engineers, Inc. - How (Un)affordable is the true cost of test?

2009 IEEE International Test Conference (ITC)

Author(s): Davidson, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355816
Regular:

Our community has spent a lot of time and effort discussing test cost, and we'd like to think we make rational decisions to reduce the cost and increase the benefits of test. Over the past... View More

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