IEEE - Institute of Electrical and Electronics Engineers, Inc. - Augmenting board test coverage with new intel powered opens boundary scan instruction

2009 IEEE International Test Conference (ITC)

Author(s): Chwee Liong Tee ; Tzyy Haw Tan ; Chin Chuan Ng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355756
Regular:

Serious erosion of board test access demands a re-look on the current test strategy. This paper describes implementation of Extest Toggle* and its effectiveness. Note *: Extest Toggle is a design... View More

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