IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low cost test point insertion without using extra registers for high performance design

2009 IEEE International Test Conference (ITC)

Author(s): Haoxing Ren ; Kusko, M. ; Kravets, V. ; Yaari, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 8
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355747
Regular:

This paper presents a new approach to improve random test coverage during physical synthesis for high performance design. This new approach performs test point insertion (TPI) to improve... View More

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