IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physical defect modeling for fault insertion in system reliability test
2009 IEEE International Test Conference (ITC)
Author(s): | Zhaobo Zhang ; Zhanglei Wang ; Xinli Gu ; Chakrabarty, K. |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 November 2009 |
Conference Location: | Austin, TX, USA, USA |
Conference Date: | 1 November 2009 |
Page(s): | 1 - 10 |
ISBN (CD): | 978-1-4244-4867-8 |
ISBN (Paper): | 978-1-4244-4868-5 |
ISSN (CD): | 1089-3539 |
DOI: | 10.1109/TEST.2009.5355715 |
Regular:
Hardware fault-insertion test (FIT) is a promising method for system reliability test and diagnosis coverage measurement. It improves the speed of releasing a quality diagnostic program before... View More