IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physical defect modeling for fault insertion in system reliability test

2009 IEEE International Test Conference (ITC)

Author(s): Zhaobo Zhang ; Zhanglei Wang ; Xinli Gu ; Chakrabarty, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355715
Regular:

Hardware fault-insertion test (FIT) is a promising method for system reliability test and diagnosis coverage measurement. It improves the speed of releasing a quality diagnostic program before... View More

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