IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design for failure analysis inserting replacement-type observation points for LVP

2009 IEEE International Test Conference (ITC)

Author(s): Nonaka, J. ; Ishiyama, T. ; Shigeta, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355707
Regular:

The method to insert observation points by replacing cells is proposed for laser voltage probing (LVP) measurements to ease failure analysis. Also proposed are a model of delay change with placing... View More

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