IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microprocessor system failures debug and fault isolation methodology

2009 IEEE International Test Conference (ITC)

Author(s): Amyeen, M.E. ; Venkataraman, S. ; Mun Wai Mak
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355702
Regular:

Diagnosis of functional failures can be used to debug design issues, isolate manufacturing defects, and improve manufacturing yield. Automated failure analysis and rapid root-cause isolation is... View More

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