IEEE - Institute of Electrical and Electronics Engineers, Inc. - A development platform and electronic modules for automated test up to 20 Gbps

2009 IEEE International Test Conference (ITC)

Author(s): Keezer, D.C. ; Gray, C. ; Majid, A. ; Minier, D. ; Ducharme, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 11
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355701
Regular:

An adaptable platform for the development of customized ATE and test-support modules is described. The purpose of the platform is to provide a hardware framework for assembling combinations of... View More

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