IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test point insertion using functional flip-flops to drive control points

2009 IEEE International Test Conference (ITC)

Author(s): Joon-Sung Yang ; Nadeau-Dostie, B. ; Touba, N.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355688
Regular:

This paper presents a novel method for reducing the area overhead introduced by test point insertion. Test point locations are calculated as usual using a commercial tool. However, the proposed... View More

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