IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test point insertion using functional flip-flops to drive control points
2009 IEEE International Test Conference (ITC)
Author(s): | Joon-Sung Yang ; Nadeau-Dostie, B. ; Touba, N.A. |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 November 2009 |
Conference Location: | Austin, TX, USA, USA |
Conference Date: | 1 November 2009 |
Page(s): | 1 - 10 |
ISBN (CD): | 978-1-4244-4867-8 |
ISBN (Paper): | 978-1-4244-4868-5 |
ISSN (CD): | 1089-3539 |
DOI: | 10.1109/TEST.2009.5355688 |
Regular:
This paper presents a novel method for reducing the area overhead introduced by test point insertion. Test point locations are calculated as usual using a commercial tool. However, the proposed... View More