IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diagnostic test generation for transition faults using a stuck-at ATPG tool

2009 IEEE International Test Conference (ITC)

Author(s): Higami, Y. ; Kurose, Y. ; Ohno, S. ; Yamaoka, H. ; Takahashi, H. ; Shimizu, Y. ; Aikyo, T. ; Takamatsu, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 9
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355681
Regular:

This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm... View More

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