IEEE - Institute of Electrical and Electronics Engineers, Inc. - Boundary-scan adoption - an industry snapshot with emphasis on the semiconductor industry

2009 IEEE International Test Conference (ITC)

Author(s): Geiger, P.B. ; Butkovich, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355673
Regular:

Increasing circuit densities and speeds are quickly reducing electrical test point access for printed circuit assembly test. Boundary-scan (JTAG/IEEE 1149.x) is a technology that will allow... View More

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