IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast extended test access via JTAG and FPGAs

2009 IEEE International Test Conference (ITC)

Author(s): Devadze, S. ; Jutman, A. ; Aleksejev, I. ; Ubar, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 7
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355668
Regular:

This paper describes a new test access protocol for system-level testing of printed circuit boards for manufacturing defects. We show that the protocol can be based on standard Boundary Scan (BS)... View More

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