IEEE - Institute of Electrical and Electronics Engineers, Inc. - Intel® IBIST, the full vision realized

2009 IEEE International Test Conference (ITC)

Author(s): Nejedlo, J. ; Khanna, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 11
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355667
Regular:

Third generation Intel® IBIST (IBIST) is the first full featured edition of what was originally envisioned in 1999. The objective was to create a standard infrastructure for validating,... View More

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