IEEE - Institute of Electrical and Electronics Engineers, Inc. - Power and thermal constrained test scheduling

2009 IEEE International Test Conference (ITC)

Author(s): Chunhua Yao ; Saluja, K.K. ; Ramanathan, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355630
Regular:

We propose a test scheduling algorithm that ensures the resource compatibility and satisfies both power and thermal constraints. The proposed algorithm can start a test at an arbitrary time and it... View More

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