IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enabling GSM/GPRS/EDGE EVM testing on low cost multi-site testers

2009 IEEE International Test Conference (ITC)

Author(s): Lai, B. ; Rivera, C. ; Waheed, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 7
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355626
Regular:

The key motivation for this work is to enable the use of low cost multi-site testers that exhibit both high transmit test stability and high throughput suitable for massive production of a 2/2.75G... View More

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