IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tolerance of performance degrading faults for effective yield improvement

2009 IEEE International Test Conference (ITC)

Author(s): Tong-Yu Hsieh ; Breuer, M.A. ; Annavaram, M. ; Gupta, S.K. ; Kuen-Jong Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355594
Regular:

To provide a new avenue for improving yield for nano-scale fabrication processes, we introduce a new notion: performance degrading faults (pdef). A fault is said to be a pdef if it cannot cause a... View More

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