IEEE - Institute of Electrical and Electronics Engineers, Inc. - Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture

2009 IEEE International Test Conference (ITC)

Author(s): Ley, A.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355572
Regular:

IEEE Std 1149.7 offers a means to reduce chip pins dedicated to test (and debug) access while enhancing the functionality of the Test Access Port (TAP) as a complementary superset of the original... View More

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