IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test access mechanism for multiple identical cores

2009 IEEE International Test Conference (ITC)

Author(s): Giles, G. ; Wang, J. ; Sehgal, A. ; Balakrishnan, K.J. ; Wingfield, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 1 November 2009
Page(s): 1 - 10
ISBN (CD): 978-1-4244-4867-8
ISBN (Paper): 978-1-4244-4868-5
ISSN (CD): 1089-3539
DOI: 10.1109/TEST.2009.5355560
Regular:

A new test access mechanism (TAM) for multiple identical embedded cores is proposed. It exploits the identical nature of the cores and modular pipelined circuitry to provide scalable and flexible... View More

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