IEEE - Institute of Electrical and Electronics Engineers, Inc. - The influence of Conducting Rough Surfaces on the performance of microwave coaxial filter

2009 3rd IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications (MAPE)

Author(s): Yuemin Ning ; Wanshun Jiang ; Jianqin Deng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Beijing, China, China
Conference Date: 27 October 2009
Page(s): 778 - 781
ISBN (Paper): 978-1-4244-4076-4
DOI: 10.1109/MAPE.2009.5355683
Regular:

Conducting Rough Surfaces (CRS) of microwave devices introduced by the manufacturing process lead to a variation in the device performance. In course of debugging microwave and millimeter wave... View More

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