IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ruin Probability of Stop-Loss Reinsurance with Diffusion Term

2009 International Conference on Management and Service Science (MASS)

Author(s): Tao Jiang ; Wu Zang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Beijing, China, China
Conference Date: 20 September 2009
Page(s): 1 - 5
ISBN (CD): 978-1-4244-4639-1
ISBN (Paper): 978-1-4244-4638-4
DOI: 10.1109/ICMSS.2009.5301011
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