IEEE - Institute of Electrical and Electronics Engineers, Inc. - Instrument design that solves the challenges of both legacy and emerging test requirements

2009 IEEE AUTOTESTCON

Author(s): Heide, C. ; Kaushansky, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 235 - 240
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314080
Regular:

In addition to designing an automatic test system (ATS) that meets a customer's current and emerging test requirements, many system integrators must also meet the challenge of creating a system... View More

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