IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bridge the gap between simulation and test: An OSA-compliant Virtual Test Environment

2009 IEEE AUTOTESTCON

Author(s): Ping Lu ; Glaser, D. ; Uygur, G. ; Weichslgartner, S. ; Helmreich, K. ; Lechner, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 214 - 219
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314059
Regular:

Virtual Test (VT) is a promising technique that facilitates test development and cuts time-to-market especially for analog/mixed-signal/RF devices. While the concept has been around for... View More

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