IEEE - Institute of Electrical and Electronics Engineers, Inc. - Built in Test - coverage and diagnostics

2009 IEEE AUTOTESTCON

Author(s): Smith, J. ; Lowenstein, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 169 - 172
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314056
Regular:

Idealy, everyone would like to embed test into their products today, whether it's to reduce costs, build in support capabilities, ensure better quality, reduce dependacy on expert technicians, or... View More

Advertisement