IEEE - Institute of Electrical and Electronics Engineers, Inc. - Adaptation of thermal testing for real - time testing in both the factory and depot

2009 IEEE AUTOTESTCON

Author(s): Lowenstein, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 415 - 418
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314055
Regular:

Since the start of thermal testing it has always been an offline process. Therefore it has baffled the best industrial engineers for optimizing and balancing flows, added undo complexity for the... View More

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