IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient techniques for reducing error latency in on-line periodic BIST

2009 IEEE AUTOTESTCON

Author(s): Al-Asaad, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 173 - 177
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314051
Regular:

With transient and intermittent operational faults becoming a dominant failure mode in modern digital systems, the deployment of on-line test technology is becoming a major design objective.... View More

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