IEEE - Institute of Electrical and Electronics Engineers, Inc. - Creating multicomputer test systems using PCI and PCI Express

2009 IEEE AUTOTESTCON

Author(s): Mohrmann, L. ; Tongen, J. ; Friedman, M. ; Wetzel, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 7 - 10
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314043
Regular:

As test systems grow larger with higher channel counts and faster digitization, new techniques are needed for managing and processing the large amount of data being generated. One technique to... View More

Advertisement