IEEE - Institute of Electrical and Electronics Engineers, Inc. - Doomsday ATE to distributed measurement blocks

2009 IEEE AUTOTESTCON

Author(s): Lowenstein, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 380 - 383
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314036
Regular:

Cost of Test, ATE utilization, floor space, flexibility⋯the list goes on and on of the issues the DoD and their primes are continually trying solve in the realm of Test. Tools like 6-Sigma... View More

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