IEEE - Institute of Electrical and Electronics Engineers, Inc. - A framework for testability metrics across hierarchical levels of assembly

2009 IEEE AUTOTESTCON

Author(s): Davidson, S. ; Ungar, L.Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 282 - 287
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314030
Regular:

We cannot improve what we cannot measure and a major issue with system test today is that we do not know how effective it is in detecting defects, diagnosing failures, and ensuring field quality.... View More

Advertisement